Back to results
Cover image for book Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement

Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement

By:Yue Ma; Christian Gontrand
Publisher:Taylor & Francis
Print ISBN:9780367023430
eText ISBN:9780429680069
Edition:1
Copyright:2019
Format:Reflowable

eBook Features

Instant Access

Purchase and read your book immediately

Read Offline

Access your eTextbook anytime and anywhere

Study Tools

Built-in study tools like highlights and more

Read Aloud

Listen and follow along as Bookshelf reads to you

As demand for on-chip functionalities and requirements for low power operation continue to increase as a result of the emergence in mobile, wearable and internet-of-things (IoT) products, 3D/2.5D have been identified as an inevitable path moving forward. As circuits become more and more complex, especially three-dimensional ones, new insights have to be developed in many domains, including electrical, thermal, noise, interconnects, and parasites. It is the entanglement of such domains that begins the very key challenge as we enter in 3D nano-electronics. This book aims to develop this new paradigm, going to a synthesis beginning between many technical aspects.