Spectroscopic Ellipsometry for Photovoltaics
Volume 1: Fundamental Principles and Solar Cell Characterization| By: | Author |
| Publisher: | Springer Nature |
| Print ISBN: | 9783319753751 |
| eText ISBN: | 9783319753775 |
| Edition: | 0 |
| Copyright: | 2018 |
| Format: | Reflowable |
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This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.