Lock-in Thermography
Basics and Use for Evaluating Electronic Devices and Materials| By: | Otwin Breitenstein; Wilhelm Warta; Martin C. Schubert |
| Publisher: | Springer Nature |
| Print ISBN: | 9783319998244 |
| eText ISBN: | 9783319998251 |
| Edition: | 3 |
| Copyright: | 2018 |
| Format: | Reflowable |
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This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.