VLSI Design and Test
22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers| By: | Author |
| Publisher: | Springer Nature |
| Print ISBN: | 9789811359491 |
| eText ISBN: | 9789811359507 |
| Edition: | 0 |
| Copyright: | 2019 |
| Format: | Reflowable |
Lifetime - $123.75
eBook Features
Instant Access
Purchase and read your book immediately
Read Offline
Access your eTextbook anytime and anywhere
Study Tools
Built-in study tools like highlights and more
Read Aloud
Listen and follow along as Bookshelf reads to you
Details
Table of Contents
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.