Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory
| By: | Rui Lan |
| Publisher: | Springer Nature |
| Print ISBN: | 9789811522161 |
| eText ISBN: | 9789811522178 |
| Edition: | 0 |
| Copyright: | 2020 |
| Format: | Reflowable |
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This book focuses on the thermophysical properties of Ge-Sb-Te alloys, which are the most widely used phase change materials, and the technique for measuring them. Describing the measuring procedure and parameter calibration in detail, it provides readers with an accurate method for determining the thermophysical properties of phase change materials and other related materials. Further, it discusses combining thermal and electrical conductivity data to analyze the conduction mechanism, allowing readers to gain an understanding of phase change materials and PCM industry simulation.